Applications of the Nanofilm Product Line

In general, ellipsometry is the analysis of reflected light with the aim to investigate physical parameter of surfaces and thin films. Non imaging systems are used when you look at homogeneous surfaces or surfaces with lateral structures not smaller than 50 micron, depending on the spot size of non imaging ellipsometers.

Imaging ellipsometers are dedicated to the investigation of ultra thin films with lateral structures down to 1 micron. The technique is applied in many different fields, from physics, material science, surface chemistry, microelectronics to biophysics and biology.

Below please find some selected application notes. If you do not find any information concerning your own measurement task, please feel free to contact the Accurion team for our experiences in your field of work.