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Caracterización de Superficie y Lámina Delgada
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Technology
Principles of Imaging Ellipsometry
Halcyonics Product Line
Nano Series data sheet
Product Flyer Acoustic Enclosures
Product Flyer Heavy Load
Product Flyer Micro Series
Product Flyer Vario Series
Product Flyer Explorer
Product Flyer Nano Series
Product Flyer Workstation
Micro Series data sheet
Micro Series - Specifications
i4 Series data sheet
Vario Series data sheet
Vario Series 45 - Specifications
Vario Series 45 Basic - Specifications
Workstations data sheet
Workstations Vario - Specifications
Workstations Micro - Specifications
Acoustic enclosures data sheet
Acoustic enclosures - Specifications
Heavy Load 45 data sheet
Heavy Load Duo - Specifications
Explorer - Specifications
Nano Series - Specifications
Nanofilm Product Line
Product Flyer nanofilm_ep3se
Product Flyer nanofilm_ultrabam
Product Flyer nanofilm_ep3sw
Product Flyer application package SPR
Product Flyer application package AFM
Product Flyer nanofilm_ep3bam
Product Flyer nanofilm_refspec
EP³ view V2.30 - Specifications
EP³ View Kinetics Software 1.0 - Specifications
EP³-BAM Tools & Z-lift - Specifications
Beam Cutter - Specifications
OptiSlides - Specifications
SPR-cell for surface plasmon resonance measurements - Specifications
SL-cell for ellipsometry in liquid ambient - Specifications
EC-Solid liquid cell - Specifications
Liquid Handling - Specifications
Peltier temperature control device - Specifications
Technical specifications of nanofilm_ep3sw
Technical specifications nanofilm_ep3bam
Application Notes
Local Influence on Optical Properties and Thickness of ITO-Films by Means of Plasma Flow
Microstructured lipid bilayers
Graphene and Graphene Oxide
Functional Coatings on Cantilevers
Laser Diodes
Characterization of an anisotropic film
Effective medium approach for nanoparticles in colloidal and photonic crystals
Mapping of a thick transparent layer
Microcontact Printed Monolayers inspected with Imaging Ellipsometry and Scanning Probe Microscopy
Thickness measurement of SiO2 layer on Si-wafer
Micropatterned Polymer Films
Characterization of glass micro array
Kinetic Binding Studies using OptiSlides
Miscellaneous
General Terms and Conditions of Accurion GmbH
Allgemeine Geschäftsbedingungen der Accurion GmbH
Software Updates
install_instructions_ep3vie~.pdf
Principles of Imaging Ellipsometry