The next step forward in Imaging Ellipsometry with the EP³-SEThe EP³-SE is the only commercially available Imaging Spectroscopic Ellipsometer and offers greater flexibility for measurements with Imaging Ellipsometry.
nanofilm_ep3se
The next step forward in Imaging Ellipsometry with the EP³-SEThe EP³-SE is the only commercially available Imaging Spectroscopic Ellipsometer and offers greater flexibility for measurements with Imaging Ellipsometry.
http://www.youtube.com/v/neiOc3Tu_o0?fs=1&hl=de_DE&rel=0
For a better impression of the nanofilm_ep3 please click on following picture to see a short video with some general descriptions.
The EP³-SE allows:
- analysis with highest accuracy and precision
- analysis of multilayer/multi parameter systems
- to choose a proper wavelength for absorbing materials
- optimized sensitivity by wavelength tuning
http://www.youtube.com/watch?v=kU7dyrbQsAk&feature=channel_video_title
Accurion EP4 modelling software
Sophisticated modelling software
Optical modelling software for imaging ellipsometry from Accurion.Please click for an introduction of the EP4Model, a powerful modelling software for analysis of ellipsometric data.
Additionally, a multiple-wavelengths mapping of the field of view (MicroMapping) is possible, yielding thickness and/or refractive index maps – similar to AFM surface topographies.
For each wavelength the highest available lateral resolution can be achieved, which makes the EP³-SE to an unique instrument for spectroscopic measurements of micro-structured samples.
The spectroscopic Imaging Ellipsometer EP³-SE uses a Xenon arc lamp to address up to 46 wavelengths between 365 nm to 1000 nm. For measurements on samples with extremely low contrast (e.g. DNA on glass, measurements under liquid ambient) an additional laser source is automatically included in the standard configuration.
Accurion invites you to submit a sample for a free evaluation.
All you have to do is download the sample submission form, fill it out completely and send it together with your sample to one of our offices.Please download the sample submisson form.
Key Features - The EP³-SE is completely equipped, ready to use, with:
- Laser 658 nm, 50 mW (other laser on request)
- Spectroscopic Box with fiber coupling
- Xe Arc lamp and 46 filters
- Motorized goniometer
- Manual Sample Handling Stage
- Open Frame
- PC and Monitor
nanofilm_ep3sw:Single Wavelength Imaging Ellipsometer
nanofilm_ep3se:Spectroscopic Imaging Ellipsometer
Technical integration – AFM:Technical Integration of a Scanning Probe Microscope
Technical integration THz TDS:Technical Integration of a Terahertz Time-Domain
Application package Imaging ellipsometry at the air/water interface:Imaging Ellipsometry at the solid/liquid interface
application package SPR:Imaging SPR in the ellipsometric mode
Please download the Product Flyer