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Dr. Peter Thiesen - Senior Application Specialist Accurion

Dr. Peter Thiesen

Senior Application Specialist

Phone: +49-551-9996020

Mail: pt@accurion.com

Daniela Bogner - Sales Manager Accurion

Daniela Bogner

Sales Manager

Phone: +49-551-9996013

Mail: db@accurion.com

Linda Thieme - Sales Manager Accurion

Linda Thieme

Sales Manager

Phone: +49-551-9996016

Mail: lth@accurion.com

Sebastian Funke - Application Specialist, 2D Materials Accurion

Sebastian Funke

Application Specialist, 2D Materials

Phone: +49-551-999600

Mail: sfu@accurion.com

Christian Röling - Application Specialist, Sample Measurements Accurion

Christian Röling

Application Specialist, Sample Measurements

Phone: +49-551-999600

Mail: cr@accurion.com

Stephan Ferneding - Chief Executive Officer Accurion

Stephan Ferneding

Chief Executive Officer

Phone: +49-551-999600

Mail:

Greg Hearn - Technical Sales Manager Accurion

Greg Hearn

Technical Sales Manager

Phone: +1-408-966-3171

Mail: gh@accurion.com

Narayana Sharma - Sales and Application Accurion

Narayana Sharma

Sales and Application

Phone: +91-80 2668 9178

Mail: sharma@accurion.com

Frank Zuo - Sales and Application Accurion

Frank Zuo

Sales and Application

Phone: +86-21 5017 9099

Mail: fz@accurion.cn

Dr. Antonio Gonzalez - Service and LB-Application Specialist Accurion

Dr. Antonio Gonzalez

Service and LB-Application Specialist

Phone: +49-551-9996035

Mail: ago@accurion.com

Arash Mirhamed - Product Manager Accurion

Arash Mirhamed

Product Manager

Phone: +49-551-9996015

Mail: am@accurion.com

Holger Grube - Service Engineer Accurion

Holger Grube

Service Engineer

Phone: +49-551-9996023

Mail: hog@accurion.com

SALES / SUPPORT
nanofilm_ep4 ellipsometer Accurion

Imaging Ellipsometer nanofilm_ep4

The new generation of microscopic thin film, surface and materials metrology tool uses a combination of auto nulling ellipsometry and microscopy to enable surface characterization with lateral resolution as small as 1 micron. This enables resolving sample areas 1000 times smaller than most non-imaging ellipsometers, even if they use micro spot spectroscopic option.
The nanofilm_ep4 uses a variety of unique features that allow the visualization of your surface in real time. You will see the structure of your sample on a microscopic scale and measure parameters like thickness, refractive index and absorption. 3D profile maps of selected areas can be recorded. Instrument combinations with other technologies like AFM, QCM-D, reflectometry, Raman spectroscopy, etc. are possible to receive even more information from your samples.

Sophisticated Modeling Software

The nanofilm_ep4 software is modular. Separate software modules simplify the instrument operation. They enable parallel or offline analysis of collected data remote from the instrument. The software modules are: AccurionServer, EP4Control, AccurionDataStudio and EP4Model. AccurionServer is an organizer of the data storage structure and of all supported data sources. EP4Control operates the instrument and includes image processing features. AccurionDataStudio allows data processing independant from the instrument. EP4Model enables modeling of complex thin films and analyzing and fitting of measured data (not required for BAM measurements).

Key Features

  • Direct sample visualization with an ellipsometric contrast image with a lateral resolution as small as 1 micron
  • Imaging ellipsometry in the wavelength range from 250 nm to 1700 nm
  • High range of accessories to cope with a variety of applications (SPR or solid/liquid cells, light guide for liquid/liquid interfaces, microfluidic, temperature control, electrochemistry cells and many more)
  • Real time ellipsometric contrast images provide a fast view of the surface, any defects or structures
  • Parallel measurement of multiple areas within the selected field of view
  • Knife edge illumination avoids background reflection and allows measurements on thin transparent substrates
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