Thin Film Characterization
Thin Film Characterization
As a combination of nulling ellipsometry and microscopy, imaging ellipsometry over-comes the limits of classical ellipsometry. Besides the determination of film thickness and optical properties, one receives ellipsometric high contrast images from the surface with highest resolution.
The Referenced Spectroscopic Ellipsometer (RSE) is a new Ellipsometer technology for ultrafast thickness mapping of coated surfaces in the thickness range of 0.1 nm-10 µm. It measures 100 points per second. In real application 67000 points on 100 mm x 100 mm are measured in only 12 minutes!
Brewster Angle Microscopy is an imaging technique for the investigation of ultra-thin films, such as monolayers at the air-water interface and Langmuir-Blodgett films on solid substrates.
Our reflection spectrometers are used to investigate orientation, association, adsorption and chemical change of chromophores in monolayers at the air water interface.